課程介紹
課程大綱
OS7129 光學元件檢測 更新日期: 2021-03-28
課程目標
修習條件
主要教本
內容大綱
1. Paraxial properties of optical systems
2. Qualification of optical materials
3. Aberrations and Zernike polynomials
4. Basic interferometry
5. Fringe analysis methods
6. Surface Profiler
7. Surface figure testing method
8. Aspherical surface testing method
9. Optical system evaluation,